Biography:
Johan DEBAYLE received his Ph.D. in the field of image processing and analysis in 2005. Currently, he is a Full Professor at MINES Saint-Etienne in France, where he leads the PMDM Department interested in image analysis of granular media. His research interests include image processing and analysis, pattern recognition and stochastic geometry. He is/was the General Chair of several international conferences and serves as Associate Editor for different international journals. He is a Fellow of the IET, Member of SPIE, IAPR, ISSIA, Senior Member of IEEE and Vice-Chair Membership of IEEE France Section.
Title : Stochastic geometrical modeling of SOC electrode microstructures